DC type B test block
Annular crack test block product introduction overview: This test block is an updated product carefully designed and manufactured based on the technical parameters proposed by BS4069 and JB/T6066 “Standard Test Block for Magnetic Particle Flaw Detection” and JB/T6063 “Magnetic Particle Technology for Magnetic Particle Flaw Detection”.
Categories: Accessories, CHiNDT
Tags: fluorescent, led, magnetic particle inspection, Magnetic Particle Testing, mpi, uv